Fig. 3From: Preparation of ZnO Nanoparticles with High Dispersibility Based on Oriented Attachment (OA) ProcessTEM, SEM, EDX, and SAED results for ZnO NPs from sample 4. a, b Low- and high-magnification TEM images showing bulk morphology of the sample and lattice fringes, respectively. b Fourier filtered image from area 1. c, d SEM images of well-dispersed particles. e SEM image of the particle used to record EDX spectrum from area 2. f SAED pattern shows wurtzite patternBack to article page