Skip to main content
Account
9398Accesses 66Citations 0Altmetric 0Mentions

Metrics

Memory Window and Endurance Improvement of Hf0.5Zr0.5O2-Based FeFETs with ZrO2 Seed Layers Characterized by Fast Voltage Pulse Measurements

Last updated: Fri, 26 Apr 2024 13:46:48 UTC

Accesses

Accesses is an approximate count of unique views and downloads. This number can fluctuate depending on multiple factors.

We update counts daily.

9398 Accesses

Citations

We get citation counts from Web of Science and CrossRef. Accuracy is dependent on their data availability.

We update counts daily.

56 Web of Science

66 CrossRef

Back to article page

Navigation