Fig. 5From: Local VOC Measurements by Kelvin Probe Force Microscopy Applied on P-I-N Radial Junction Si NanowiresSPV versus light power obtained on isolated RJ NWs. The measurements were performed with different AFM tip shapes (ARROW-EFM and ATEC-EFM) and different directions of illumination (top and side). The reference RJ device designates the device 1 illustrated in Fig. 4a. The AFM image at the bottom right shows an example of the topography measured on isolated NWsBack to article page