Fig. 3From: Effects of Post Annealing on Electrical Performance of Polycrystalline Ga2O3 Photodetector on SapphireThe XRD peaks of a\( \left(\overline{2}01\right) \) plane and b\( \left(\overline{6}03\right) \) plane of the samples before and after annealing. c peak position and d plane spacing of \( \left(\overline{2}01\right) \) and \( \left(\overline{6}03\right) \) planesBack to article page